| Customization: | Available |
|---|---|
| After-sales Service: | 1year |
| Warranty: | 1year |
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Product Specification
1.Flash memory chip intelligent test system HD-512-NAND is a comprehensive flash memory test system that can customize the test plan and support parallel testing of various types of flash memory particles. 64 types, the maximum number of flash memory particles in parallel testing can reach 512.| Inner box size | W760×D400×H890mm |
| Outer box size | W1870×D890×H1830mm |
| volume | 270L |
| Opening method | Single door (right open) |
| cooling method | air-cooled |
| weight | about 950KG |
| power supply | AC 380V About 7.5 KW |
| temperature range | -70ºC~150ºC |
| Temperature fluctuation | ≤±0.5ºC ≤±1ºC |
| temperature offset | ≤±2ºC |
| temperature resolution | 0.01ºC |
| Heating rate | 5ºC/min(mechanical cooling, under standard load) |
| temperature change rate | High temperature can meet 5ºC~8ºC/min nonlinear adjustable (measured at the air outlet, mechanical refrigeration, under standard load), low temperature can meet 0ºC~2ºC/min nonlinear Adjustable (measured at the air outlet, mechanical cooling, under normal load) |
| temperature uniformity | ≤±2ºC |
| standard load | 10KG aluminum block, 500W load; |
| GB/T5170.2-2008 Temperature test equipment GB/2423.1-2008 (IEC60068-2-1:2007) low temperature test method AB. GB/2423.2-2008 (IEC60068-2-2:2007) high temperature test method BA. GJBl50.3 (MIL-STD-810D) high temperature test method. GJBl50.4 (MIL-STD-810D) low temperature test method. |
| Display | Color LCD display |
| Operation mode | Program mode, fixed value mode |
| Setting | Chinese and English menu (optional), touch screen input |
| Setting range | Temperature: Adjust according to the temperature working range of the equipment (upper limit +5°C, lower limit -5°C) |
display resolution |
Temperature: 0.01°C Time: 0.01min |
control method |
BTC balanced temperature control method + DCC (intelligent cooling control) + DEC (intelligent electrical control) (temperature test equipment) BTHC balanced temperature and humidity control method + DCC (intelligent cooling control) + DEC (intelligent electrical control) (temperature and humidity test equipment) |
Curve record function |
It has RAM with battery protection, which can save the set value, sampling value and sampling time of the device; the maximum recording time is 350 days (when the sampling period is 1.5min) |
Accessory function |
Fault alarm and cause, processing prompt function Power-off protection function Upper and lower limit temperature protection function Calendar timing function (automatic start and automatic stop operation) self-diagnosis function |







After-Service: