Flash Memory Chip Intelligent Test Equipment

• Customization: Available
• Power Supply: AV 220V
• Certification: CE, ISO
• Model NO.: HD-N8-NAND
• Warranty: 1 Year
• Equipment Size: W400*H510*D520mm
• Supported Voltage: Hardware Support V1.2, V1.8 Optional
• Operating Humidity Range: 45%~75%
• Normal Working Power Consumption: 2kw
• Transport Package: Strong Wooden Case
• Specification: W400*H510*D520mm
• Trademark: Haida
• Origin: China
• Production Capacity: 300pieces/Month

Product Description

Flash Memory Chip Intelligent Test System

Product Description:

1. The Smart Test System YC-N8-NAND is a comprehensive flash memory test system that can be customized to test up to 8 flash particles in parallel.
2. It supports a wide range of test patterns and customized test parameters. It provides a one-click basic test flow, highly flexible experimental test, and advanced test flow, and can It provides one-click basic test flow, highly flexible experimental test and advanced test flow, which can realize various functional tests such as remaining life prediction, the real test, data retention and read disturbance of flash memory particles. The test report can be exported quickly and easily after the completion of the test. It provides the most intuitive graphical test data to provide the most accurate reference for flash particle classification and application. It also provides the most accurate reference for flash particle classification and application and enables intelligent grading based on flash particle quality test results.

Product Specifications:

1. Tested by JEDEC Stand No. 218: Solid State Technology Association B-2016 Solid-State Drive (SSD) Requirements And Endurance Test Motho;
2. Test basis following JEDEC Standard No. 47 NVCE: Solid State Technology Association Stress-TestDriven Qualification of Integrated Circuits;
3. Test board design specifications to meet industrial-grade test temperature environment requirements;

Technical Specifications:

Physical properties
Equipment size	W400×H510×D520mm
Power supply method	AC
Operating voltage range	AC(220±10%)V single-phase 2-wire + protective earth
Normal working power consumption	2KW
Operating temperature range	-30ºC~150ºC
Storage temperature range	-20ºC~60ºC
Operating Humidity Range	45%~75%
System performance
Number of particles that can be tested in parallel	1~8 pcs
Supported flash brands for testing	SLC, MLC, TLC, Sandisk, etc. from Micron, Intel, YMTC, Hynix, Toshiba, Sandisk, etc, QLC type NAND Flash chip particles (range is being extended)
Package sizes supported	BGA152, BGA132 (custom extensions available)
Supported Flash Protocol Types	ONFI/toggle interface particles
Supported Voltage	Hardware support V1.2, V1.8 optional
Supported Voltage Pull-Off Range	Software support can be fine-tuned vcc2.3~3.6 vccq1.2 1.15~1.25 vccq1.8 1.70~1.95
Supports optional test ranges	Individual settings for number of starting blocks, inter-block interval, number of cycles, test time, etc.
Support pattern	All 0, all 1, all 5, pseudo-random, checkerboard grid, word line random, etc.
Support for test command types	Flash Memory Information Inspection Flash Memory Performance Testing Life Testing and Prediction Quality Class Classification Data Interference Testing Data Retention Testing Read-Retry Functionality Lifetime Testing and Prediction ECC Customisation
Parallel test speed	As an example of a long-lived wellington pellet base test: Balanced mode: 128GB *8 pellets approx. 1 hour Full mode: 128GB*8 pellets approx. 2 hours High-speed mode: 128GB*8 pellets approx. 20 minutes
Intelligent test module	Basic tests Experimental Tests Advanced tests

Our Company Introduction:
HAIDA INTERNATIONAL is a professional manufacturer of various kinds of testing equipments over 24 years. HAIDA products are widely used in paper products, packaging, ink printing, adhesive tapes, bags, footwear, leather products, environment, toys, baby products, hardware, electronic products, plastic products, rubber products and other industries, and applicable to all scientific research units, quality inspection institutions and academic fields.