SATA Intelligent Test System Chip Recognition Test Machine

• Customization: Available
• Warranty: 1year
• Temperature Range: -70 Degrees to +180 Degrees
• Model NO.: HD-6-SATA
• Type of Test: Abnormal Power Failure Tests and Aging Tests
• Control: Intelligent Control of All Tests Using Software
• Main Hardware Components: Test PC Test Motherboards
• Transport Package: Strong Wooden Cases
• Trademark: Haida
• Origin: China
• Production Capacity: 300pieces/Month

Product Description

SATA Intelligent Test System Chip Recognition Test Machine

Key Features:

1. Support for the testing of SATA products;
2. Support for customization of the number of test pieces produced for SATA, e.g. 96 pieces, 124 pieces, 196 pieces, 256 pieces, etc;
3. Support for the development of micro and small customizations, e.g. 6, 12, 18, etc;
4. Support (-70 degrees to +180 degrees) testing;
5. Support for abnormal power failure tests and aging tests;
6. Support for automated temperature control testing;
7. Support for intelligent control of all tests using software;
8. Support for the customisation of test software;
9. Support for air speed and temperature equalization in the chamber;
10. Support for rapid temperature rise and fall control;
11. Support for customized development of SATA aging;
12. Support for networked control, allowing off-site control of the test and viewing of test results;
13. support for APP remote control testing;

Main Components of The Machine:

1. The complete test system consists of a high and low temperature chamber, TEST PC motherboard, BASEBOARD and PM boards, ESD test fixtures, transmission data CABLE cables, ESD front and rear insulated fibre panels, touch screen operating platform mainframe, customised sealing plugs, ESD front PC motherboard stand, special test power supply, FPGA boards, etc.

Main Hardware Components:

1. TEST PC test motherboards;
2. BASEBOARD boards;
3. Complete machine circuits and power control components;
4. ESD test fixtures for anti-static products;
5. ESD antistatic front and rear insulating fiber sheets;
6. Silicone seals for high and low-temperature resistance;
7. ESD antistatic front computer motherboard racks;
8. Transmission data CABLE cable;
9. Special test power supplies;
10. Gigabit switch;
11. Console host.

Main Components of The Software And Hardware Section:

1. Test PC: 1 set including motherboard, CPU, HDD, hard disk, and power supply. The Test PC hardware is mainly configured according to the following PCT, BIT, MDT, and FDS;
2. Console: a set of high-quality touch PC hosts that can control the entire Test PC operation, is the control interface for the test, is used to send test commands and configuration scripts, and is the command center of the test;

Description of The SSD SATA Intelligent Hardware and Software Integrated Test System:

1. The PCIe SSD intelligent test system is based on the Win10 operating system platform. Through the open scripting mode, the temperature of the high and low-temperature chamber and the test items of the PCIE product can be modified at will, and the data can be transferred through the LINUX system and the road oiler to achieve one-click operation, network control, saving labor, intelligent data management and permanent retention of test results.
2. It is designed for the reliability and long-term stability of SSDPCIE, including hardware, software, and mechanism design, the goal is to make the test as automated as possible, the test configuration items more flexible, the available test channels more, and save space.

System Features

1. The PCBA and fixtures are housed in a custom chamber with several to dozens of PC boards (depending on the size of the chamber, small chambers for SSD verification and large chambers for SSD production). This saves space and increases the number of boards to be tested (multiple sets can easily be set up).
2. One PC motherboard can be connected and tested with 6 SATA SSDs at the same time, supporting SATA2.0 and SATA3.0 type SSDs.
3. Customizable Linux and Windows test software, test content can be configured by one or more script files. Supports various power failure tests, Burn-In-Test, power consumption check tests, etc.
4. A Windows PC can be connected to several test system PCs via Ether-net, and script editing on the Windows side can be used to automatically control the temperature of the Chamber and perform multiple test items.
5. Support for SSD power consumption measurement and checking.
6. Supports UART Log function to collect all the messages sent by each SSD under test through its UART Port (SSD designs must support the connection of UART signals to specific pin gold fingers).
7. Custom Linux test software connects to the board via the USB interface.

Power Cycling Test:

1. The main purpose of this test is to verify that the SPOR is working properly. This usually includes the following power down tests.
2. After all SSD write commands have been completed, the PC issues a standby immediate command, and then powers down. This is used for NOPLP CAP SSDs.
3. After all SSDwrite commands are completed, the PC is powered off immediately. After powering up again, all data written before the last power failure should be compared.
4. (SPOR) Power off while writecommand is still in progress. After powering up again, all data written before the last power failure needs to be compared.
5.  The program execution thread used by the Write SSD is not related to the countdown thread, so random power off is guaranteed.
6. Power Consumption Test.
7. Tests power consumption during read, write and idle to screen out power hungry SSDs.
8. Performance Test.
9. Tests read and write performance to screen out abnormal SSDs.
10. Burn-In Test.
11. Similar to the Windows Burn-In-Test LBA Mode test, 7 patterns are available.

4 bytes, address of this LBA

504 bytes, assigned data pattern

4 bytes, time-stamp

Test PC Description:

1. Test PC is mainly used to test SSD power loss, mass read/write comparison, full disk read/write, aging test of media with specified patterns, statistics of new bad blocks and protocol testing, etc. Test PCT is mainly divided into the following categories: PCT, BIT, MDT and FDS.
2. PCT (Power Cycling Test): Various Pattern abnormal power loss tests, testing the power loss processing and reconstruction of SSD algorithms, verifying the integrity of data during abnormal power loss.
3. BIT (Burn-In Test): verifies that various patterns are read/written sequentially or randomly, and the impact of various patterns on the media.
4. MDT (Multi-Drive Test): Verifies that the SSD supports the commands of the ATA1-8 specification, sends the supported commands to the SSD and verifies that the results have no
5. The results will be verified for any problems.
6. FDS (Full Drive Scan): A full drive read and write operation on the SSD to verify that the mapping table is correct;

Test PC Detailed Features:

1. PCT Power Cycling Test

1. Configuration of the various patterns;
2. Configuration of read/write data sizes;
3. Sequential versus random read/write comparison configurations;
4. verification of abnormal power-off versus normal power-off data integrity;
5. scripting to control power-up and power-down times;
6. Specifying data read/write operations for LBAs;
7. Testing SSD algorithms for power-down processing and reconstruction;
8. testing UPS stability and capacitive load demand values;
9. Testing of disk boot times;
10. Testing the stability of the product's power management functions;
11. Testing UPS aging of test disks;
12. Testing of board-level electronic components for soldering at high and low temperatures;
13. the possibility of using it to verify the power failure protection of SSD products on the market
14. verification of SSD compatibility with various motherboards;
15. Verification of Trim;
16. Automatic saving of test logs and regular uploads;

 

1. BIT Burn-In Test

1. Validation of sequential read/write matching and performance for various Pattens;
2. verification of random read/write comparisons and performance for various Patten;
3. Statistics on the impact of various patterns on the media;
4. Aging testing of the various Patten products;
5. Full and automatic testing of all Patterns;
6. Sector count and Pattern can be scripted;
7. Test time for read/write comparison verification can be set;
8. Counting of new bad blocks during testing;
9. Specify the Frame size to test the full functionality of the product;
10. Verification of the data path between DDR, Flash, and the interface;
11. Verification of SSD random read/write performance stability;
12. Automatically save test logs and upload them at regular intervals;

 

1. MDT Multi Drive Test

1. Sector number configurable;
2. LBA28 and LBA48 are configurable;
3. Verification of the compatibility of the product's interface protocols;
4. Verification of the product's support for the commands specified in the protocol and its statistics;
5. The possibility of specifying commands to perform relevant tests on the product;
6. verification of read/write operations for the DATA command and comparison of the data;
7. Verification of No-Data command support;
8. Automatic saving of test logs and regular uploads;

 

1. FDS Full Drive Scan

1. Full disk read and write operations to verify the correctness of the disk mapping table and to perform comparison operations;
2. Pattern and Sector numbers are configurable;
3. Configurable timing for read/write operations;
4. Screening of Flash for bad blocks and Weak blocks;
5. Validation of DDR against all blocks of Flash;
6. Verify that the SSD algorithm mapping table is correct;
7. Automatic saving of test logs and regular uploading;

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