| Customization: | Available |
|---|---|
| Certification: | CE |
| Wavelength Range: | 190nm-900nm |
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The machine radiates light with characteristic spectral lines of the element to be measured from the light source. When passing through the sample vapor, it is absorbed by the ground state atoms of the element to be measured in the vapor. The content of the element to be measured in the sample is determined by the degree to which the radiation characteristic spectral line light is weakened.
| Wavelength range | 190nm-900nm |
| Wavelength accuracy | ±0.2nm |
| Wavelength repeatability | ±0.1nm |
| Spectral bandwidth | 0.1nm, 0.2nm, 0.4nm, 0.7nm, 1.0nm, 2.0nm |
| Light source | Element lamp |
| Number of light sources | 6 lamp stands/8 lamp stands optional |
| Grating lines | 1800 |
| Baseline stability: |
Static baseline drift: ≤±0.002A/30min Dynamic baseline drift: ≤±0.004A/30min |
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